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List of Products 127 Result

PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

Tipless - Non-Contact/Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High Resonance Frequency,High sensitivity,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge,Enhanced Resolution

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,Stiffness,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

Al High Aspect Ratio (> 5:1) - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1, Tilted 13°) - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

High Aspect Ratio (> 5:1) - Non-Contact/Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

High Resonance Frequency,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping mode - High Resonance Frequency - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

ELECTRONICS - SENSOR   |  AFM TIP

SuperSharpSilicon - Non-Contact / Tapping Mode - High Resonance Frequency

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Dissipate Static Charge,Unrivalled Sharpness

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever - Reflex Coating

ELECTRONICS - SENSOR   |  AFM TIP

PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever - Reflex Coating

Switzerland Switzerland NanoWorld

Properties :

High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging
PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever

ELECTRONICS - SENSOR   |  AFM TIP

PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever

Switzerland Switzerland NanoWorld

Properties :

Inert,High sensitivity,Fast Scanning Ability,Dissipate Static Charge

Application :

Atomic force microscope (AFM) tips,AFM imaging